LVDS Signal Quality: Jitter Measurements Using Eye Patterns Test Report #1
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Jitter Measurements for CLK Generators or Synthesizers - Application Note - Maxim
Clock (CLK) generators and synthesizers form the pulse of a complex digital system and errors in a clock's signal quality can have wide-ranging effect. One of the most important performance measurements is clock jitter. Jitter is defined as "the short-term variation of a signal with respect to its ideal position in time." In a clock generator chip, there are many factors which contribute to out...
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In jitter analysis, jitter is decomposed into components, most of which are uniquely defined. However, some components use terminology that has caused confusion. For example, terms such as duty-cycle distortion (DCD) in data signals, DCD in clock signals, pulse width jitter (PWJ), and periodic jitter (PJ) at half of the data rate have meanings that depend on application, standards specification...
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This paper presents a new jitter tolerance model that includes the effect of deterministic jitter in interconnects. First, it is shown by experiment that the deterministic jitter in a cable can significantly affect its jitter tolerance. Then, the new jitter tolerance model is verified with experimental data on cables of various lengths, using both PRBS and T11 test patterns.
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Problem Statement. Everyone will agree that a key issue in the design of multi-GHz interface devices is jitter performance. To characterize jitter performance, do you measure timing jitter or period jitter of the device? Should the Bit Error Rate performance of the device also be tested? Is there any way to shorten the overall test time? And as always, is there a way to reduce the test cost? Fu...
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تاریخ انتشار 2011